The Materials Instrumentation Center provides researchers in the Lamar University community with access to high-end instrumentation for the studies of material properties. The Materials Instrumentation Center also supports collaborative research projects with users from other Educational institutes and industries.

Instruments:

Scanning Electron Microscope (Hitachi S-3400N)

Scanning Electron Microscope (SEM) provides information on surface shape, surface finish, surface texture, and structural characterization.

Transmission Electron Microscope (JEOL JEM-1400Plus (HR-FC))

Transmission Electron Microscopy (TEM) is an electron microscopy technique that is used to image the fine structure in the scale of several Angstroms (~ 0.19nm).

PEOPLE

Chun-Wei Yao, Ph.D.
Associate Professor
Director, Materials Characterization Center

Zhe Fan, Ph.D.
Assistant Professor
Faculty Advisory Committee

Robert Kelley Bradley, Ph.D.
Assistant Professor
Faculty Advisory Committee

Jenny Zhou, Ph.D.
Associate Dean of College of Engineering, Interim Department Chair, Professor
Faculty Advisory Committee

For any inquiries or questions regarding instruments, instrument rates, billing, please contact Dr. Yao. 

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